Toward in-line monitoring of the microstructure of organic semiconductor materials for photovoltaic applications via spectroscopic ellipsometry
- Título : Toward in-line monitoring of the microstructure of organic semiconductor materials for photovoltaic applications via spectroscopic ellipsometry
- Autores: Quesada-Ramirez, Arianna; Wang, Rong; Luer, Larry; Brabec, Christoph J.; Campoy-Quiles, Mariano
- Citation and DOI:
Appl. Phys. Lett. 128, 261111 (2026)
DOI: 10.1063/5.0332798 - PlumX: Toward in-line monitoring of the microstructure of organic semiconductor materials for photovoltaic applications via spectroscopic ellipsometry
A new paper has been published in Applied Physics Letters:
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