The X-ray Diffraction Laboratory is a consolidated service of the ICMAB institute. The main objective of the service is to meet the needs of the different departments of the center offering the maximum possible benefits to the institute users and it is also available to external users.
Based on the principles of X-ray diffraction, a wealth of structural and microstructural information about crystalline materials can be derived. In materials science, knowledge of the structure and composition of the materials studied is a key requirement for understanding their properties.
Our fast, accurate and customized services include data collection, qualitative and quantitative phase analysis as well as texture measurements (pole figures), residual stress, reciprocal space maps, etc. The most common function of the service is the acquisition of X-ray diffraction data under different conditions, e.g. by using flat sample and Bragg-Brentano geometry, thin film diffraction, texture determination on layers, microdiffraction and qualitative analysis in capillary materials.
The Siemens D-5000 is a powder diffractometer well suited for the analysis of powder samples and qualitative analysis.
The specifications of this diffractometer are:
The applications for this diffractometer are:
This unit is equipped with a centric Eulerian cradle and a VANTEC-500 area detector. This combination gives the Bruker D8 the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, determination of particle size, percent crystallinity, and structural identification.
The D8 DISCOVER is an X-ray diffraction instrument, perfect for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, RSM measurements and structural phase identification. The equipment can works in two differents configurations, Bragg-Brentano and Parallel configuration.
The specifications of this diffractometer are:
The applications for this difractometer are:
The D8 Advance A25 is equipped by two different configurations, Bragg-Brentano geometry with electrochemical cell (Cu radiation) and Debye-Scherrer geometry (Mo radiation) with a Johansson monochromator for capillary measurements.
The specifications are:
The applications for this diffractometer are:
Powder Diffraction Software:
EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis, structure analysis
Materials Research Software:
MULTEX –Texture analysis
LEPTOS – Thin film analysis/Residual stress
X-Ray Diffraction
Service
ICMAB
Campus UAB
(in front of Firehouse)
08193, Bellaterra
Spain
By email:
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By phone:
+34 935801853
Ext. 290
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