The Soft Lab hosts a CSIC course on "Characterization techniques for Particulate Materials"
The Soft Lab, run by Amable Bernabé, has hosted from Monday, 7 October, to Wednesday, 9 October a course on "Characterization techniques for particulate materials". The course has counted with 12 participants from different CSIC centers (including ICMAB, IBM-CNM, ICM, IQAC...) and has introduced the participants to different techniques to characterize nanoparticles and other particulate matter, including the basic fundamentals, sample preparation, practical examples and results interpretation.
It is the second time that Amable Bernabé, technician from the Sof tLab, has decided to offer this course to all the CSIC community, so they can learn new methods to characterize nanoparticles, the theory behind the techniques, and how to manage the equipment.
"The course is very interesting and useful. Amable gives us a lot of information of the techniques" said a participant of the course.
Specifically, the techniques shown are:
Theory:
- Dynamic Light Scattering (DLS) with Zetasizer Nano ZS (Malvern Instruments)
- Size distribution
- Z Potential
- Nanoparticle Tracking Analysis (NTA) with Nanosight NS300 (Malvern Instruments)
- Size distribution
- Particle concentration
- Fluorescence
- Light Scattering (LS) with Mastersizer 2000 (Malvern Instruments)
- Size distribution
Practice:
- Sample analysis and practical cases of Dynamic Light Scattering with the Zetasizer Nano ZS (Malvern Instruments) equipment.
- Samples analysis and practical cases of the Nanoparticle Tracking Analysis (NTA) technique with the Nanosight NS300 (Malvern Instruments) equipment.
- Sample analysis and practical cases of the Light Scattering (LS) technique with the Mastersizer 2000 (Malvern Instruments) instrument.
