The paper has been coauthored by Ignasi Fina and Florencio Sánchez, both from the FOXEM group at ICMAB-CSIC.

The article is about how real-time atomic-scale imaging reveals the presence of reversible transitions between ferroelectric and non-ferroelectric phases during electric stimuli, enabling the possibility for reliability improvement in ferroelectric materials compatible with complementary metal–oxide–semiconductors.

Reference:

Nature Materials, volume 23, pages1015–1016 (2024)

DOI: 10.1038/s41563-024-01930-z