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Prof. Dr. Jordi Arbiol |
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Short Bio: Born in Molins de Rei, Barcelona, Catalonia, Spain (1975). Graduated in Physics at Universitat de Barcelona (UB), where he also obtained his Ph.D. (European Doctorate and PhD Extraordinary Award) in 2001 in the field of transmission electron microscopy (TEM) applied to nanostructured materials. He also worked at the microscopy facilities and as Assistant Professor of the Electronics Department at UB, focussing in TEM advanced techniques. He is currently ICREA Research Professor at Institut de Ciència de Materials de Barcelona, CSIC, is the group leader of the Group of Advanced Electron Nanoscopy, member of the Superconducting Materials Department, responsible at ICMAB and at FUSIO project (CSIC-UAB) of the Electron Microscopy Area and member of the Executive Board of the Spanish Microscopy Society. |
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Research Interests: The increasing interest in Materials Science, Nanoscience and Nanotechnology has created a serious global need for the development of nanoscopy tools in order to be able to observe and chemically analyze the synthesized nanostructures at atomic scale. I have centered my research on the application and development of nanoscopy advanced tools related to the electron nanoscopy in order to solve the technological questions that nanotechnology asks for. |
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Honors: - 2009: Member of the Executive Board of the Spanish Microscopy Society. |
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Awards: - 2003: PhD Extraordinary Award (Electronics Department, Universitat de Barcelona). Ph.D. Thesis title: "Metal Additive Distribution in TiO2 and SnO2 Semiconductor Gas Sensor Nanostructured Materials" |
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Number of Published Papers in ISI Journals: |
129 |
